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Synchrotron-like performance in the lab : With the ZEISS Xradia 800 Ultra X-ray microscope, achieve spatial resolution down to 50 nm, the highest among lab-based X-ray imaging systems. With non-destructive 3D imaging playing a vital role in today’s breakthrough research, you will experience unparalleled performance in an ultra-high resolution lab-based system. The innovative Xradia Ultra architecture features absorption and phase contrast imaging modes and X-ray energy of 8 keV, using unique optics adapted from the synchrotron. With Xradia 800 Ultra, expect to accomplish unrivaled in situ and 4D capabilities for studying material evolution over time and extend the limits of X-ray imaging used in materials science, life sciences, natural resources, and diverse industrial applications.
- With resolution as fine as 50 nm, Xradia 800 Ultra provides you with insight into microscopic structures and processes previously not accessible with conventional lab-based X-ray technology. Operating with 8 keV X-rays provides excellent penetration and contrast for a wide range of materials, enabling you to observe structures and materials in their natural state.
- ZEISS integrated phase contrast technology employing the Zernike method allows enhanced visibility of grain boundaries and material interfaces when absorption contrast is low, providing you with visibility of ultra- and nano-structures without staining.
- ZEISS Xradia 800 Ultra delivers reliable internal 3D information otherwise only accessible with destructive methods like cross-sectioning. The large working distance and atmospheric sample environment allow you to perform in situ studies with ease.
- Non-destructive 3D X-ray imaging allows repeated imaging of the same sample allowing direct observation of microstructural evolution
- High resolution down to 50 nm is maintained for imaging of samples within in situ devices
- Automated image alignment for tomographic reconstruction
- Switchable field-of-view ranging from 15 to 60 µm
- Absorption and Zernike phase contrast imaging modes
- Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient
- Now with Scout-and-Scan Control System with an easy workflow-based user interface, ideal for the central imaging lab where users may have a wide variety of experience levels
- Materials Research - For advanced materials development: study and predict material properties and evolution. Characterize 3D structures of composite materials, such as fuel cells, polymers and composites. Measure and identify porosity, cracks, phase distribution etc. Material of different densities may be segmented through the use of absorption-contrast imaging.
- Raw Materials - Oil & gas drilling feasibility studies: perform virtual core analysis to reduce time to results. Nanoscale pore structure measurements for geological samples can now be conducted in a few hours compared to traditional core analysis. Perform flow modeling on the nanoscale to complement submicron imaging with the Versa microscope. Understand geomechanics under load, study the effects of tensile pressure on metals, or analyze ceramics under pressure.
- Life Sciences - Xradia 800 Ultra offers the ability to visualize the internal structure of biological specimens, such as bone and soft tissue, with resolution down to 50 nm. It offers superior contrast, nanoscale 3D X-ray imaging for a variety of materials such as polymers for drug delivery, tissue samples, and scaffolds for tissue engineering.
- Electronics - Xradia 800 Ultra offers visualization of semiconductor samples for electronics packaging research and development.
Understand nanostructural changes in 3D under load : ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.
- Add in situ nanomechanical testing capabilities to your Xradia Ultra nanoscale 3D X-ray microscope (XRM)
- Acquire 3D tomograms of your sample under load with resolution down to 50 nm
- Perform a variety of nanomechanical tests such as compression, tension, and indentation
- Study a wide range of materials including metals, ceramics, composites, polymers and biomaterials
- Complement your mechanical test results from electron microscopy, microCT and stand-alone test set-ups to understand behavior across multiple length scales: from the atomic level and the nanoscale to the micro and macro scale.
- Available in two models with different force measurement:
- LS108: 0.8 N maximum force
- LS190: 9 N maximum force
- Compatible with:
- ZEISS Xradia 800 Ultra
- ZEISS Xradia 810 Ultra
- Xradia UltraXRM-L200
- Xradia nanoXCT-200
How it works : ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.
Key applications : In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials.
- High strength alloys
- Biomaterials / biomechanics
- Building materials
- Fibers / composites