We are associated with a team of deft professionals who make sure that the offered lot is prepared using the finest grade material only. For this, we have tied-up with the prominent vendors in the market. Our team of quality analysts strictly tests each product against varied quality parameters ensuring zero defects at buyer's end.
Details
- Measure roughness and contour in a single run
- Low measuring error in in the X direction: ± (0.2+L/1.000) µm; ± 0.4 µm at L=200 mm
- Tracing driver straightness error: 0.05 + (3L/10,000) µm; 0.11 µm/200 mm
- Measuring system (X axis): diffraction scale
- Measuring system (Z axis): laser interferometer for excellent precision
- Extremely good stylus system resolution: 0.31 nm/50 mm
- More universal and exact thanks to the outstanding ratio of the measuring range to resolution: 42,000,000:1
- High travel speed of up to 200 mm/s
- 200 mm tracing driver with a patented, non-contact linear drive
- Swiveling X tracing driver of approx. ± 45° offers greater flexibility
- Long penetration depth for measuring deep workpiece components via a cylindrical stylus system
- Optional topography measurement
- Base: solid and attractively-priced FX version with integrated, active vibration damping that is suitable for production or a space-saving DX version
